Open Circuit Voltage Scan (OCV)

This method measures the OCV of a device under test (DUT) over a specific time period, with the potentiostat switched off during measurement.

The OCV method waits for the hold time t_hold before evaluating the potential steady-state criteria (maximum potential change |∆E| within a defined time window ∆t).

A maximum duration (t_max) for OCV determination is specified to ensure the measurement has a defined endpoint. If steady-state is not reached within t_max, the measurement will terminate automatically.

Parameter Description

Parameter	Name	Description	Unit
t _max	runtime	maximum duration of the open circuit scan	s
t _hold	hold time	time window from the start of the OCV in which the termination criterion do not yet apply (minimum runtime)	s
Stability	\(\frac{\|∆E\|}{∆t}\)	potential stabilization criterion for early termination of the OCV scan	\(\frac{V}{s}\)
ODR	output data rate	number of measurement points per second note: the current is always measured at the maximum possible speed and integrated for the selected data rate	\(\frac{1}{s}\)

Diagram of the open circuit voltage scan, illustrating the potential of the device under test recorded over time while the potentiostat is switched off.

Measurement Result

The open circuit voltage drift is recorded as a function of time.

Example result of an open circuit voltage scan, showing the open circuit voltage drift of the device under test as a function of time.

Custom Experiment Builder

This experiment is a combination of the following blocks:

Open Circuit Measurement